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PUBLICATIONS

Bidirectional Ellipsometry and its Application to the Characterization of Surfaces, ed. by D.H. Goldstein and R.A. Chipman

Published

Author(s)

Thomas A. Germer, Clara C. Asmail
Citation
Polarization Measurement Analysis and Remote Sensing SPIE
Volume
3121
Pub Type
Journals

Citation

Germer, T. and Asmail, C. (1997), Bidirectional Ellipsometry and its Application to the Characterization of Surfaces, ed. by D.H. Goldstein and R.A. Chipman, Polarization Measurement Analysis and Remote Sensing SPIE (Accessed October 20, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created January 1, 1997, Updated February 17, 2017
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