Tsai, B.
, Meyer, C.
and Lovas, F.
(2000),
Characterization of Lightpipe Radiation Thermometers for The NIST Test Bed, 8th Intl. Conf. on Advanced Thermal Processing of Semiconductors, Gaithersburg, MD (Accessed May 15, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Characterization of Lightpipe Radiation Thermometers for The NIST Test Bed
Published
Author(s)
, C W. Meyer,
Proceedings Title
8th Intl. Conf. on Advanced Thermal Processing of Semiconductors
Conference Location
Gaithersburg, MD
Conference Title
Proc. 8th Intl. Conf. on Advanced Thermal Processing of Semiconductors
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created January 1, 2000, Updated February 17, 2017