Hamann, H.
, Gallagher, A.
and Nesbitt, D.
(1998),
Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution, Applied Physics Letters
(Accessed May 11, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Enhanced sensitivity near-field scanning optical microscopy at high spatial resolution
Published
Author(s)
H F. Hamann, A Gallagher,
Citation
Applied Physics Letters
Volume
73
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 1997, Updated October 12, 2021