Combinatorial Peel Tests for the Characterization of Adhesion Behavior of Polymeric Films

Published

February 1, 2005

Author(s)

R Song, Martin Chiang, A J. Crosby, Alamgir Karim, Eric J. Amis, Naomi Eidelman

Abstract

The self-adhesion behavior of an optically smooth poly(methyl methacrylate) (PMMA) thin film (ca.. 100 nm) on different evaporated metal substrates has been investigated using a combinatorial method approach. In this investigation through high-throughput peel tests, the relationship between annealing time, annealing temperature, surface energy, and ultraviolet degradation to the film adhesion has been examined. In addition, atomic force microscopy, optical microscopy and Fourier transform infrared microspectroscopy techniques have been adopted to elucidate the observations on the adhesion behavior from the peel tests. The results of this study demonstrate that the proposed combinatorial approach to characterize the dependence of adhesion on adhesion-controlling parameters has the potential to assess various factors affecting the adhesion.

Citation

Plasma Processes and Polymers

Volume

46

Issue

No. 5

Pub Type

Journals

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Keywords

adhesion, annealing time and temperature, Combinatorial Method, contact angle, peel test, PMMA

Citation

Song, R. , Chiang, M. , Crosby, A. , Karim, A. , Amis, E. and Eidelman, N. (2005), Combinatorial Peel Tests for the Characterization of Adhesion Behavior of Polymeric Films, Plasma Processes and Polymers, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852403 (Accessed October 11, 2025)