Combinatorial and High-Throughput Measurement of the Modulus of Thin Polymer Films

Published

June 1, 2005

Author(s)

Christopher M. Stafford, Shu Guo, Martin Y. Chiang, C Harrison

Abstract

Considerable attention has been devoted to developing fabrication strategies for constructing combinatorial material libraries as well as tools for characterizing the chemical and physical properties of such libraries. Less attention has been dedicated to designing high-throughput metrologies for probing the engineering properties of combinatorial libraries. Here, we describe the design and refinement in our high-throughput buckling-based metrology developed to ascertain the mechanical properties (e.g., modulus) of combinatorial thin film libraries. To illustrate the combinatorial and high-throughput capability of this metrology, thin films possessing a gradient in modulus were generated by stacking two polymer films of disparate moduli possessing gradients in film thickness. The local thickness and modulus ratios of each component in the composite film then dictate the measured modulus of the laminate film as a function of spatial position.

Citation

Review of Science Instruments

Volume

76 No 6

Pub Type

Journals

Download Paper

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Keywords

buckling, combinatorial, gradient, high-throughput, mechanical properties, mechanics, metrology, modulus

Citation

Stafford, C. , Guo, S. , Chiang, M. and Harrison, C. (2005), Combinatorial and High-Throughput Measurement of the Modulus of Thin Polymer Films, Review of Science Instruments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852438 (Accessed April 30, 2024)