MeasuringThe Modulus of Polymer Films by Strain-Induced Buckling Instabilities

Published

August 1, 2002

Author(s)

Christopher M. Stafford, C Harrison, Alamgir Karim, Eric J. Amis

Abstract

We present a high-throughput technique for measuring the Young s modulus of thin polymer films. This technique exploits a strain-induced buckling instability observed in films supported on elastomeric substrates. By employing a combinatorial polymer film library where position on the sample dictates composition and/or thickness, one can measure via light scattering the moduli of hundreds of polymer films in minutes. We validate that this technique is robust for polystyrene films over a thickness range of 70-140 nm. The focus of this paper is the establishment of this technique and its application to films of thickness comparable to the polymer chain s radius of gyration where novel mechanical effects should arise.

Proceedings Title

American Chemical Society: Division of Polymer Chemistry, National Meeting | 24th | | American Chemical Society

Volume

43

Issue

No. 2

Conference Dates

August 1, 2002

Conference Location

Boston, MA

Conference Title

Polymer Preprints

Pub Type

Conferences

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Keywords

buckling, deformation, elastomer, instability, mechanical properties, modulus, PDMS, polystyrene, thin films

Citation

Stafford, C. , Harrison, C. , Karim, A. and Amis, E. (2002), MeasuringThe Modulus of Polymer Films by Strain-Induced Buckling Instabilities, American Chemical Society: Division of Polymer Chemistry, National Meeting | 24th | | American Chemical Society, Boston, MA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852030 (Accessed October 12, 2025)