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PUBLICATIONS

Calibration of Electron Microscopies: How to Do This, How Often, Pit-falls, and Problems

Published

Author(s)

Michael T. Postek

Abstract

This is the highly edited text of a presentation made during the Microscopy and Microanalysis session on core facility management regarding the calibration of electron microscopes. This segment of the presentation was regarding the calibration of scanning electron microscopes and is a compilation of work previously published.
Citation
Microscopy Today
Pub Type
Journals

Keywords

accurate, magnification, scanning electron microscope, standard reference materials
Manufacturing and Metrology

Citation

Postek, M. (2002), Calibration of Electron Microscopies: How to Do This, How Often, Pit-falls, and Problems, Microscopy Today (Accessed June 7, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created September 1, 2002, Updated February 19, 2017
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