Wight, S.
(1999),
What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?, Microscopy and Microanalysis
(Accessed May 10, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?
Published
Author(s)
Abstract
Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about these unwanted contributions.Citation
Microscopy and Microanalysis
Volume
5
Pub Type
Journals
Keywords
energy dispersive spectrometry, environmental SEM, quantitative analysis, scanning electron microscope
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created August 1, 1999, Updated February 19, 2017