The Manufacturing Engineering Laboratory (MEL) has a unique mission of discrete part manufacturing technology within the National Institute of Standards and Technology''s (NIST) mission of measurement, standards, data and infrastructure technology. Several visits to industrial and government research laboratories and two workshops were organized as part of a MEL Exploratory project in FY99. The prioritized needs for NIST efforts in Nano, Micro and Meso manufacturing were identified by industry experts in this field contacted during these activities. The identified needs at the Meso and Micro Scale include: Dimensional and Mechanical Metrology, Assembly and Packaging Technology and Standards, and Providing a Science Base for Materials and Processes (emphasizing materials testing methods and properties data). Nanocharacterization, Nanomanipulation, Nanodevices and Magnetics Industry Support have been identified at the Nano Scale. Nanometrology and Nanomanipulation have a substantial base from which to expand on within MEL. Therefore, MEL is initiating a new long-term Strategic Program in Nano-Manufacturing to conduct research and development, to provide the measurements and standards needed by industry to measure, manipulate and manufacture nano-discrete part products. The program will address the measurement and standards issues associated with the manufacture of both nano-discrete-part products themselves, as well as with the development of the production systems required for their manufacture. The future of Nano Micro and Meso Scale manufacturing operations will be strongly influenced by a new breed of assembly and manufacturing tools that will be intelligent, flexible, more precise, include in-process production technologies and make use of advanced part design, assembly and process data. The flexible manufacturing tools of the future will be a system integration effort of all the best MEL has to offer.
Citation: Nanotribology: Critical Assessment and Research Needs
Publisher Info: Springer-Verlag New York, LLC, New York, NY
Pub Type: Books
assembly and packaging, dimensional metrology, discrete part manufacturing, measurement standards, meso manufacturing, nano-manufacturing, nanocharacterization, nanodevices, nanomanipulation