Tang, Y.
and Miller, W.
(2000),
Interlaboratory Comparison of Josephson Voltage Standards (JVS) Between NIST and Lockheed Martin Astronautics (LMA), Proc., Conference on Precision Electromagnetic Measurements (CPEM), Sydney, 1, AS, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=4886
(Accessed October 13, 2025)
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Interlaboratory Comparison of Josephson Voltage Standards (JVS) Between NIST and Lockheed Martin Astronautics (LMA)
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Author(s)
,
Abstract
Two JVS systems operated at the NIST and LMA were compared by using four traveling Zener standards. A MAP protocol was adopted for the comparison. The mean difference between the measurements of the two laboratories was found to be 0.059 5V with an expanded uncertainty of 1 0.218 5V with 95% confidence.Proceedings Title
Proc., Conference on Precision Electromagnetic Measurements (CPEM)
Conference Dates
May 14-19, 2000
Conference Location
Sydney, 1, AS
Pub Type
Conferences
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Keywords
effective degrees of freedom, Josephson voltage standard, Measurement Assurance Program, uncertainty, Welch-Satterthwaite formula, Zener pressure correction
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Created April 30, 2000, Updated October 12, 2021