Cage, M.
, Jeffery, A.
and Elmquist, R.
(1998),
Suggested Triple-Series Connection Measurement Tests of the AC Quantized Hall Resistance and the AC Longitudinal Resistance, Tech. Dig., Conf. on Precision Electromagnetic Measurements, Washington, DC, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29591
(Accessed October 8, 2025)
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Suggested Triple-Series Connection Measurement Tests of the AC Quantized Hall Resistance and the AC Longitudinal Resistance
Published
Author(s)
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Abstract
We find from equivalent circuit calculations that a single ac ratio bridge could be used to measure the ac quantized Hall resistance and to also provide independent values of the ac longitudinal resistance in a quantum Hall effect device by making quantized Hall resistance measurements for two different combinations of triple-series connections to the device.Proceedings Title
Tech. Dig., Conf. on Precision Electromagnetic Measurements
Conference Dates
July 6-10, 1998
Conference Location
Washington, DC
Pub Type
Conferences
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Keywords
ac quantum Hall effect, equivalent electrical circuit, longitudinal resistance, multi-series connections, quantized Hall resistance
Citation
Issues
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Created June 30, 1998, Updated October 12, 2021