Newell, D.
, Whitenton, E.
, Kramar, J.
, Pratt, J.
and Smith, D.
(2004),
Progress Towards SI Traceable Force Metrology for Nanomechanics, Journal of Materials Research
(Accessed November 21, 2025)
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Progress Towards SI Traceable Force Metrology for Nanomechanics
Published
Author(s)
, , , ,
Abstract
This paper is based, in its entirety, on NIST-approved publications: Calibration of Piezoresistive Cantilever Force Sensors Using the NIST Electrostatic Force Balance, The NIST Electrostatic Force Balance Experiment, The NIST Microforce Realization and Measurement Project, and Microforce and Instrumented Indentation Research at the National Institute of Standards and Technology, Gaithersburg, MD.Citation
Journal of Materials Research
Volume
19(1)
Pub Type
Journals
Keywords
calibration, force metrology, instrumented indentation research, microforce, nanomechanics
Citation
Issues
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Created December 31, 2003, Updated October 12, 2021