Postek, M.
(1995),
Scanning Electron Microscopy at the National Institute of Standards and Technology, EM Views
(Accessed January 29, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Scanning Electron Microscopy at the National Institute of Standards and Technology
Published
Author(s)
Abstract
An attitude has developed that the results of any SEM measurement arc absolutely true. If this were the case, there would be no need for standards and no metrological problems would exist in making submicrometer measurements. Multiple, basic errors associated with metrology in the SEM can exist. These were clearly demonstrated in the SEM interlaboratory study in which Texas A&M participated. Many of these problems can be overcome by calibration and careful use of the instrument. The SEM has become the technology of choice for submicrometer metrology, yet one must be extremely careful when doing any type of metrology with this instrument.Citation
EM Views
Issue
10
Pub Type
Others
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created January 1, 1995, Updated February 19, 2017