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PUBLICATIONS

Blind Estimation of Tip Geometry in Scanned Probe Microscopy

Published

Author(s)

John S. Villarrubia

Abstract

Broadening of surface protrusions is a well-known imaging artifact in scanned probe microscope topographs. Blind reconstruction is a method for estimating the tip shape from the image of a tip characterizer, without independent knowledge of the characterizer geometry. A description of and a plausibility argument for blind reconstruction are given. A recent development for discriminating against other (non-tip-induced) image artifacts is summarized.
Proceedings Title
Proceedings of Microscopy and Microanalysis
Volume
3
Issue
Supplement 2
Conference Dates
August 1, 1997
Conference Location
Unknown, USA
Pub Type
Conferences

Keywords

atomic force microscopy, blind reconstruction, scanned probe microscopy, scanning tunneling microscopy, tip artifacts, tip estimation
Manufacturing and Metrology

Citation

Villarrubia, J. (1997), Blind Estimation of Tip Geometry in Scanned Probe Microscopy, Proceedings of Microscopy and Microanalysis, Unknown, USA (Accessed October 10, 2025)

Issues

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Created August 1, 1997, Updated February 19, 2017
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