Villarrubia, J.
(1997),
Tip and Surface Reconstruction in Scanned Probe Microscopy, Program of the 4th Industrial Applications of Scanned Probe Microscopy; NIST, Gaithersburg, MD
(Accessed July 17, 2025)
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Tip and Surface Reconstruction in Scanned Probe Microscopy
Published
Author(s)
Abstract
The non-vanishing size of tips in scanned probe microscopes (e.g., atomic force microscope or scanning tunneling microscope) results in imaging errors. Correction of these errors requires estimation of the tip shape (tip reconstruction) followed by estimation of the surface shape from the measured image (surface reconstruction). Published surface and tip reconstruction methods are reviewed.Proceedings Title
Program of the 4th Industrial Applications of Scanned Probe Microscopy; NIST
Conference Dates
January 1, 1997
Conference Location
Gaithersburg, MD
Pub Type
Conferences
Keywords
atomic force microscopy, blind reconstruction, scanned probe microscopy, scanning tunneling microscopy, surface reconstruction, tip artifacts, tip estimation
Citation
Issues
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Created January 1, 1997, Updated February 19, 2017