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Soft X-Ray Absorption Spectroscopy of the MgB2 Boron K Edge in an MgB2/Mg Composite
Published
Author(s)
Daniel A. Fischer, A R. Moodenbaugh, Q Li, G Gu, Y Zhu, J W. Davenport, D O. Welch, H Su
Abstract
Soft x-ray absorption (XAS), using fluorescence yield, was used to study the boron K near edge in MgB2 superconductor. The sample consists of MgB2 crystallites randomly oriented in a magnesium matrix. Abrasion of the sample surface in vacuum provides a surface relatively free of boron-containing impurities. The intrinsic boron K near edge spectrum of the sample at a temperature of 295 K is identified. This spectrum is then compared in detail with a spectrum calculated using the full potential linearized augmented plane wave method. Features predicted by the theory appear near the expected energies, with qualitative agreement regarding shape and intensity.
Fischer, D.
, Moodenbaugh, A.
, Li, Q.
, Gu, G.
, Zhu, Y.
, Davenport, J.
, Welch, D.
and Su, H.
(2006),
Soft X-Ray Absorption Spectroscopy of the MgB<sub>2</sub> Boron K Edge in an MgB<sub>2</sub>/Mg Composite, Modern Physics Letters B
(Accessed October 9, 2025)