Benz, S.
and Hamilton, C.
(2004),
Application of the Josephson Effect to Metrology, Proceedings of the IEEE, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31547
(Accessed October 13, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Application of the Josephson Effect to Metrology
Published
Author(s)
, Clark Hamilton
Abstract
The unique ability of a Josephson junction to control the flow of magnetic flux quanta leads to a perfect relationship between frequency and voltage. Over the last 30 years, metrology laboratories have used this effect to greatly improve the accuracy of dc voltage standards. More recent research is focused on combining the ideas of digital signal processing with quantum voltage pulses to achieve similar gains in ac voltage metrology. The integrated circuits that implement these ideas are the only complex superconducting electronic devices that have found wide commercial application.Citation
Proceedings of the IEEE
Volume
92
Issue
10
Pub Type
Journals
Download Paper
Keywords
frequency, metrology, superconductor, synthesis, voltage standard
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created October 1, 2004, Updated February 19, 2017