We measure and compare the electrical parasitics of contact pads of different designs fabricated on silicon integrated circuits and develop a strategy for reducing the parasitics.
Proceedings Title: Dig., 9th Elect. Perf. Elect. Pkg. Conf.
Conference Dates: October 23-25, 2000
Conference Location: Scottsdale, AZ
Pub Type: Conferences
characteristic impedance, contact pads, measurement, silicon, substrate effect