High Frequency Measurements of CoFeHfO Thin Films

Published

July 1, 2001

Author(s)

Stephen E. Russek, Pavel Kabos, Thomas J. Silva, Fred B. Mancoff, D Wang, Z. T. Qian, J. M. Daughton

Abstract

High frequency measurements of the transverse susceptibility and damping constant of CoFeHfo thin films have been made over a frequency range of 0.1 GHz to 6 GHz as a function of film resistivity, thickness, and temperature. The films show relatively low high-frequency damping with the damping constant a ranging from 0.01 to 0.06. The damping constant increases with film resistivity and, for the highest resistivity films, the damping constant decreases as the thickness increases. The damping constant, induced anisotropy, and film resistivity show weak temperature dependence over a temperature range from 4 K to 300 K. The low damping constant, in conjunction with the high anisotropy and large spin-dependent tunneling magnetoresistance, makes this material attractive for high frequency magnetic device applications.

Citation

IEEE Transactions on Magnetics

Volume

37

Issue

4

Pub Type

Journals

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Keywords

CoFeHfO, FMR, magnetic device dynamics, magneto-electronics

Citation

Russek, S. , Kabos, P. , Silva, T. , Mancoff, F. , Wang, D. , Qian, Z. and Daughton, J. (2001), High Frequency Measurements of CoFeHfO Thin Films, IEEE Transactions on Magnetics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=15471 (Accessed October 27, 2025)