Woodward, J.
(2003),
Choosing a Cantilever for In Situ Atomic Force Microscopy, Microscopy Today (Accessed August 21, 2026)
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Choosing a Cantilever for In Situ Atomic Force Microscopy
Published
Author(s)
Abstract
This manuscript is a non-peer reviewed, invited tutorial for Microscopy Today. It describes the issues involved in choosing a cantilever for atomic force microscope (AFM) imaging under fluids. In situ AFM imaging is an increasingly popular technique for imaging biological samples in their native environments. The desirable characteristics of the cantilever's spring constant, resonance frequency and quality factor are explained. The cantilever is modeled as a damped, driven, harmonic oscillator to explicate the relationship between these parameters and how they influence image quality.Citation
Microscopy Today
Pub Type
Journals
Keywords
AFM, atomic force microscopy, in situ imaging, microcantilever
Citation
Issues
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Created April 1, 2003, Updated February 19, 2017