NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Effect of a Compressive Uniaxial Strain on the Critical Current Density of Grain Boundary in Superconducting YBa2Cu3O7-δ Films
Published
Author(s)
Daniel C. van der Laan, Timothy J. Haugan, Paul N. Barnes
Abstract
Grain boundaries can be a significant barrier for current flow in high temperature superconducting (HTS) thin films. We show that an applied compressive strain causes a remarkable increase in critical current density (Jc,GB) in thin film YBa2Cu3O7-δ (YBCO) grain boundaries. The data presented here clearly show that the strain dependence of Jc,GB is somewhat surprisingly identical to that of the intragrain critical current density (Jc), contrary to present understanding. A relatively straightforward model is shown to describe and predict how strain affects the current transfer in grain boundaries, where it provides an estimate of the lattice strain at the grain boundary.
van, D.
, Haugan, T.
and Barnes, P.
(2009),
Effect of a Compressive Uniaxial Strain on the Critical Current Density of Grain Boundary in Superconducting YBa<sub>2</sub>Cu<sub></sub>3O<sub>7-δ</sub> Films, Physical Review Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=901381
(Accessed October 12, 2025)