NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A High-Throughput Thermoelectric Power-Factor Screening Tool for Rapid Construction of Thermoelectric Property Diagrams
Published
Author(s)
Makoto Otani, Nathan Lowhorn, Peter K. Schenck, Winnie K. Wong-Ng, Martin L. Green, K Itaka, H Koinuma
Abstract
We have developed a high throughput screening tool that maps out thermoelectric power factors of combinatorial composition-spread film libraries. The screening tool allows us to measure the electrical conductivity and Seebeck coefficient of over 1000 sample points within 6 hours. Seebeck coefficients of standard films measured with the screening tool are in good agreement with those measured by traditional thermoelectric measurement apparatus. The rapid construction of thermoelectric property diagrams is illustrated for two systems: (Zn,Al)-O binary composition-spread film on Al2O3 (0001), and (Ca, Sr, La)3Co4O9 ternary composition-spread film on Si (100).
Otani, M.
, Lowhorn, N.
, Schenck, P.
, Wong-Ng, W.
, Green, M.
, Itaka, K.
and Koinuma, H.
(2007),
A High-Throughput Thermoelectric Power-Factor Screening Tool for Rapid Construction of Thermoelectric Property Diagrams, Applied Physics Letters
(Accessed October 17, 2025)