Hackley, V.
, Fritts, M.
, Kelly, J.
, Patri, A.
and Rawle, A.
(2009),
ENABLING STANDARDS FOR NANOMATERIAL CHARACTERIZATION, INFOSIM INFORMATIVE BULLETIN OF THE INTERAMERICAN METROLOGY SYSTEM (Accessed May 7, 2026)
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ENABLING STANDARDS FOR NANOMATERIAL CHARACTERIZATION
Published
Author(s)
, Martin Fritts, , Anil K. Patri, Alan F. Rawle
Abstract
A two-day international workshop was convened recently in order to scope out and address the urgent need for standards to accurately characterize the physico-chemical and biological properties of engineered nanomaterials. These standards are needed by industry and regulatory bodies in order to meet requirements for the production, application and lifecycle risk management of nanomaterial-based products ranging from cancer therapeutics to high-tech coatings and composites. The current deficiency in the availability of such standards, including both documentary and reference artifacts, is perceived as limiting the widespread adoption and implementation of nanoscale technologies. Herein is given a brief summary of that workshop, its findings and recommendations.Citation
INFOSIM INFORMATIVE BULLETIN OF THE INTERAMERICAN METROLOGY SYSTEM
Pub Type
Others
Keywords
nanotechnology, standards, nanomaterial, nanobiotechnology, metrology
Citation
Issues
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Created August 13, 2009, Updated February 19, 2017