We discuss the limitations of vector network analyzers in the measurement of nonlinear devices and circuits, including their inability to measure the relative phase between frequency components and the actual impedance in which a device is embedded. The architectures and calibration techniques for several types of instruments designed to satisfy these requirements are presented and compared. Examples of the use of these instruments for measurement and model development of nonlinear circuits are presented.
Proceedings Title: 73rd ARFTG Microwave Measurement Symposium
Conference Dates: June 12, 2009
Conference Location: Boston, MA
Pub Type: Conferences
Linear measurements, Measurement-based Model, Nonlinear measurements, Nonlinear vector network analyzer, Vector network analyzer