NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Frequency Measurements of Al+ and Hg+ Optical Standards
Published
Author(s)
Wayne M. Itano, James C. Bergquist, Till P. Rosenband, David J. Wineland, David Hume, Chin-wen Chou, Steven R. Jefferts, Thomas P. Heavner, Tom Parker, Scott Diddams, Tara Fortier
Abstract
Frequency standards based on narrow optical transitions in 27Al+ and 199Hg+ ions have been developed at NIST. Both standards have absolute reproducibilities of a few parts in 1017. This is about an order of magnitude better than the fractional uncertainty of the SI second, which is based on the 133Cs hyperfine frequency. Use of femtosecond laser frequency combs makes it possible to compare the optical frequency standards to microwave frequency standards or to each other. The ratio of the Al+ and Hg+ frequencies can be measured more accurately than the reproducibility of the primary cesium frequency standards. Frequency measurements made over time can be used to set limits on the time variation of fundamental constants, such as the fine structure constant alpaha} or the quark masses.
Itano, W.
, Bergquist, J.
, Rosenband, T.
, Wineland, D.
, Hume, D.
, Chou, C.
, Jefferts, S.
, Heavner, T.
, Parker, T.
, Diddams, S.
and Fortier, T.
(2009),
Frequency Measurements of Al+ and Hg+ Optical Standards, Proc. 2009 ICOLS Conference, Hokkaido, JP, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903328
(Accessed October 9, 2025)