VanLandingham, M.
, Villarrubia, J.
, Meyers, G.
and Dineen, M.
(2000),
Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties, Microscopy and Microanalysis, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=860249
(Accessed October 11, 2025)
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Advancing Nanoscale Indentation Measurements Toward Quantitative Characterization of Polymer Properties
Published
Author(s)
Mark R. VanLandingham, , G F. Meyers, M D. Dineen
Abstract
The ultimate objective of instrumented indentation testing is to obtain absolute measurements of material properties and behavior. To achieve this goal, accurate knowledge of the shape of the indenter tip is required. For indentation measurements involving sub-micrometer scale contacts, accurate knowledge of the tip shape can be difficult to achieve. In this paper, a technique referred to as blind reconstruction is applied to the measurement of tip shapes of indenters used with the atomic force microscope to indent polymeric materials.Citation
Microscopy and Microanalysis
Volume
6
Issue
Suppl. 2
Pub Type
Journals
Download Paper
Keywords
AFM, elastic modulus, force mode, tip shape calibration
Citation
Issues
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Created July 31, 2000, Updated October 12, 2021