Direct Measurement of Plowing Friction and Wear of a Polymer Thin Film Using the Atomic Force Microscope

Published

May 1, 2001

Author(s)

B -. Du, Mark R. VanLandingham, Q Zhang, T -. He

Abstract

Nanometer-scale plowing friction and wear of a polycarbonate thin film were directly measured using an atomic force microscope (AFM) with nanoscratching capabilities. During the nanoscratch tests, lateral forces caused discrepancies between the maximum forces for the initial loading prior to the scratch and the unloading after the scratch. In the case of a nanoscratch test performed parallel to the cantilever probe, the plowing friction will add another component to the moment acting at the cantilevered end compared to the case of nanoindentation, resulting in an increased deflection of cantilever. Using free-body diagrams for the cases of nanoindentation and nanoscratch testing, the AFM force curves were analyzed to determine the plowing friction and the coefficient of plowing friction during nanoscratch testing. Also, by combining nanoscratch and nanoindentation testing, the energetic wear rate of the polycarbonate thin film was measured.

Citation

Journal of Materials Research

Volume

16

Issue

No. 5

Pub Type

Journals

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Keywords

atomic force microscopy, diamond-tipped probe, nanoscale mechanics

Citation

Du, B. , VanLandingham, M. , Zhang, Q. and He, T. (2001), Direct Measurement of Plowing Friction and Wear of a Polymer Thin Film Using the Atomic Force Microscope, Journal of Materials Research, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=860289 (Accessed October 18, 2025)