Hudson, L.
, O'Brien, C.
, Feldman, U.
, Seltzer, S.
, Park, H.
and Seely, J.
(2011),
Efficiency calibrations of cylindrically bent transmission crystals in the 20 keV to 80 keV x-ray range, Optics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907535
(Accessed October 22, 2025)
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Efficiency calibrations of cylindrically bent transmission crystals in the 20 keV to 80 keV x-ray range
Published
Author(s)
, , Uri Feldman, Stephen M. Seltzer, Hye-Sook Park, John F. Seely
Abstract
Two quartz (10-11) crystals were cylindrically bent to 25.4 cm radius of curvature and were mounted in identical Cauchois type transmission spectrometers, and the crystal diffraction efficiencies were measured to 5 % absolute accuracy using narrow bandwidth x-ray source fluences in the 20 keV to 80 keV energy range. The measured integrated reflectivity values were compared to calculations performed using a computational model that accounts for the diffraction geometry of the bent transmission crystal. These crystal calibrations enable the accurate measurement of absolute hard x-ray emission levels from laser-produced plasmas and other laboratory sources.Citation
Optics Letters
Volume
36
Pub Type
Journals
Download Paper
Keywords
diffraction, x-ray spectroscopy, x-ray
Citation
Issues
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Created April 15, 2011, Updated February 19, 2017