NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Incorporation of Defects into the Central Atoms Model of a Metallic Glass
Published
Author(s)
Eric Lass, Aiwu Zhu, Gary J. Shiflet, S J. Poon
Abstract
The central atoms model (CAM) of a metallic glass is extended to incorporate thermodynamically stable defects, similar to vacancies in a crystalline solid, within the amorphous structure. A bond deficiency (BD), which is the proposed defect present in all metallic glasses, is introduced into the equations of CAM. Like vacancies in a crystalline solid, BDs are thermodynamically stable entities because of the increase in entropy associated with their creation, and there will be an equilibrium concentration present in the glassy phase. When applied to Cu- and Ni-Zr binary metallic glasses, the concentration of thermally induced BDs surrounding Zr atoms reaches a relatively constant value at the glass transition temperature, regardless of composition within a given glass system. Using this critical defect concentration, the predicted temperatures at which the glass transition is expected to occur are in good agreement with experimentally determined glass transition temperatures for both alloy systems.
Lass, E.
, Zhu, A.
, Shiflet, G.
and Poon, S.
(2011),
Incorporation of Defects into the Central Atoms Model of a Metallic Glass, ACTA Materialia, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907351
(Accessed October 14, 2025)