Introduction to special issue on single-photon technologies

Published

March 10, 2011

Author(s)

Alan L. Migdall, Sergey V. Polyakov, Jingyun Fan, Ivo P. Degiovanni, Jessica Cheung

Abstract

This special issue accompanies the 4th international conference on single-photon technologies held at the National Institute of Standards and Technology (NIST) Boulder in November 2009. This community has met every two years at national metrology institutes following the initial meeting in 2003 at NIST Gaithersburg. The aim of these workshops is to share progress in single-photon technologies, which has been rapid, and has led to continual evolution in the issues that are most important to the community. The Journal of Modern Optics has brought together a collection of related papers in support of every workshop thus far. The first special issue of the journal, covering the first workshop of 2003 was largely dominated by single-photon detection with semiconductor detectors, as this was the most mature of the technologies. The second workshop, two years later, saw many more contributions on single-photon sources. At the 3rd workshop properties of superconducting single-photon detectors were in the focus through a special symposium in conjunction with EU Framework 7 project Sinphonia. Stefan Scheel presented the topical review on the single-photon sources and their key applications.

Citation

Journal of Modern Optics

Volume

58

Issue

3-4

Pub Type

Journals

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Local Download

Keywords

Single photon, single photon detector, single photon source, metrology, quantum information

Citation

Migdall, A. , Polyakov, S. , Fan, J. , Degiovanni, I. and Cheung, J. (2011), Introduction to special issue on single-photon technologies, Journal of Modern Optics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907536 (Accessed October 7, 2025)