NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy

Published

Author(s)

Jason P. Killgore, Roy H. Geiss, Donna C. Hurley

Abstract

Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to changes in contact radius is directly detected in situ. We find that in-situ results agree well with existing ex-situ techniques, while providing additional robust wear information that would not be resolved ex situ. Additionally, we find that CR-FM mapping does not affect the wear mechanism compared to standard contact scanning.
Citation
Small
Pub Type
Journals

Download Paper

Local Download

Keywords

Contact Resonance Force Microscopy, Atomic Force Microscope, Tip Wear, tribology, nanotribology
Nanometrology

Citation

Killgore, J. , Geiss, R. and Hurley, D. (2011), In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy, Small, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=907208 (Accessed October 16, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created March 15, 2011, Updated February 19, 2017
Was this page helpful?