Shaw, G.
, Pratt, J.
and Kubarych, Z.
(2011),
Calibration of dynamic sensors for noncontact-atomic force microscopy, Proceedings of the Workshop on SPM Standardization, NCAFM 2010, Kanizawa, -1 (Accessed April 29, 2026)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Calibration of dynamic sensors for noncontact-atomic force microscopy
Published
Author(s)
, ,
Abstract
Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning fork-type sensors. The method eliminates uncertainties due to tip location, provides for direct calibration in ambient, liquid, ultrahigh vacuum (UHV), and cryogenic environments, and offers a route to measurements potentially traceable to the International System of Units (SI). The spring constants obtained with the dynamic calibration method agree with a traceable measurement made using instrumented indentation [1].Proceedings Title
Proceedings of the Workshop on SPM Standardization, NCAFM 2010
Conference Dates
August 2-6, 2010
Conference Location
Kanizawa
Conference Title
NCAFM 2010
Pub Type
Conferences
Keywords
atomic force microscopy, small mass, spring constant, calibration, nanotechnology
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created August 12, 2011, Updated February 19, 2017