Prins, J.
(2003),
NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control, NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control (Accessed May 4, 2026)
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NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control
Published
Author(s)
J Prins
Abstract
This chapter presents techniques for monitoring and controlling processes and signaling when corrective actions are necessary. It covers both statistical process control (SPC) and statistical quality (SQC). SPC is based on a comparison of what is happening today with what happened previously to guarantee that process has not degraded. SQC is a technique for inspecting enough product from given lots to ensure a specified quality level.The chapter can be accessed via urlhttp://www.itl.nist.gov/div898/handbook/pmc/pmc.htmCitation
NIST/SEMATECH Engineering Statistics Handbook Chapter 6: Process or Product Monitoring and Control
Pub Type
Others
Keywords
acceptance sampling, capability indices, control charts, multivariate control, multivariate time, process control, time series
Citation
Issues
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Created June 1, 2003, Updated February 17, 2017