We use near-field polarimetry (NFP) to investigate thin film crystallites of isotactic polystyrene (iPS). NFP micrographs enabled quantitative optical characterization of the birefringence in these specimens with sub-diffraction limited resolution, resulting in novel observations. In particular, we detect evidence for radial strain in the depletion boundary surrounding the growth front, as well as evidence for tilt in the crystal axis and strain in the amorphous layers above and below the growth plane of the crystallites.
Citation: Applied Physics Letters
Pub Type: Journals
depletion region, isotactic polystyrene, NSOM, polarimetry, polymer crystallization