Instrumentation, Metrology, and Standards, Three Keys to the Nanotech Kingdom

Michael T. Postek; Kevin W. Lyons

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PUBLICATIONS

Instrumentation, Metrology, and Standards, Three Keys to the Nanotech Kingdom

Published

May 1, 2009

Author(s)

Michael T. Postek, Kevin W. Lyons

Citation

http://mm.printless-publishing.com/1-4/

Pub Weblink

http://mm.printless-publishing.com/1-4/

Pub Type

Websites

Keywords

nanomanufacturing, micromanufacturing, metrology, NNI, National Nanotechnology Initiative

Chemical engineering and processing, Manufacturing, Metrology and Nanotechnology

Citation

Postek, M. and Lyons, K. (2009), Instrumentation, Metrology, and Standards, Three Keys to the Nanotech Kingdom, http://mm.printless-publishing.com/1-4/, [online], http://mm.printless-publishing.com/1-4/ (Accessed May 9, 2026)

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Created May 1, 2009, Updated February 19, 2017

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