A Method to Compare Vector Nonlinear Network Analyzers

Published

May 1, 2001

Author(s)

Kate Remley, Donald C. DeGroot, Jeffrey Jargon, Kuldip Gupta

Abstract

We address the difficult problem of determining measurement consistency between two vector nonlinear network analyzers, a new class of stimulus-response instruments that acquire multiharmonic waveform data instead of normalized network parameters. We develop a set of nonlinear verification devices and a method to compare the systems, and then demonstrate that measurements from three different nonlinear network analyzers are consistent to within 1.3% of the amplitude of the applied stimulus signal.

Proceedings Title

Tech. Dig., IEEE MTT-S International Microwave Symposium

Volume

3

Conference Dates

May 20-25, 2001

Conference Location

Phoenix, AZ, USA

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/MWSYM.2001.967225

Local Download

Keywords

assurance, diode circuits, measurement, measurement consistency, measurement intercomparison, nonlinear measurements, nonlinear vector network analyzer, nonlinear verification

Citation

Remley, K. , DeGroot, D. , Jargon, J. and Gupta, K. (2001), A Method to Compare Vector Nonlinear Network Analyzers, Tech. Dig., IEEE MTT-S International Microwave Symposium, Phoenix, AZ, USA, [online], https://doi.org/10.1109/MWSYM.2001.967225, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=14478 (Accessed October 22, 2025)