Advancements in Development of an Ultra-Precision, SI-Traceable Nanoindentation Platform

Published

November 2, 2010

Author(s)

Douglas T. Smith, Stuart T. Smith, Bartosz K. Nowakowski

Abstract

This paper presents a discussion of the design features of a precision indentation platform for measuring indents with traceable uncertainties at the nanometer scale. In particular, the goal of the instrument is to simultaneously measure penetration distance of an indenter tip into a surface as a function of the applied load. Components of the design that will be discussed include: capacitance gauges for measurement of indenter penetration and load; AC bridge balancing for high sensitivity; a proximity probe for surface location sensing; a null control to create a constant force measurement datum from the measurement surface; alignment of the proximity probe relative to the indenter tip; and preliminary results from proximity probe sensitivity testing.

Proceedings Title

Proceedings of the American Society of Precision Engineering 25th Annual Meeting

Conference Dates

October 31-November 4, 2010

Conference Location

Atlanta, GA

Conference Title

American Society of Precision Engineering 25th Annual Meeting

Pub Type

Conferences

Keywords

nanoindentation, nanomechanical testing

Citation

Smith, D. , Smith, S. and Nowakowski, B. (2010), Advancements in Development of an Ultra-Precision, SI-Traceable Nanoindentation Platform, Proceedings of the American Society of Precision Engineering 25th Annual Meeting, Atlanta, GA (Accessed October 13, 2025)