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PUBLICATIONS

Sources of Error in Absolute Distance Interferometry

Published

Author(s)

Jack A. Stone Jr., Alois Stejskal, Lowell P. Howard

Abstract

In this paper we describe the status of our research on the use of diode lasers for absolute distance interferometry, and we discuss the major sources of uncertainty that limit the accuracy of this technique for distance measurement. We have primarily employed a 670 nm external cavity diode laser as the tunable source for our interferometer, but currently we are developing a system based on an 852 nm distributed Bragg reflector laser. These two lasers have very different strengths and weaknesses; the primary sources of uncertainty in length measurement depend on which laser is employed.
Proceedings Title
Proceedings of Laser Metrology 1999
Conference Dates
October 1, 1999
Conference Location
Florsanopolis, BR
Conference Title
Laser Metrology
Pub Type
Conferences

Keywords

absolute distance interferometry, diode laser, laser interferometry, wavelength sweeping
Manufacturing and Metrology

Citation

Stone, J. , Stejskal, A. and Howard, L. (1999), Sources of Error in Absolute Distance Interferometry, Proceedings of Laser Metrology 1999, Florsanopolis, BR (Accessed December 25, 2025)

Issues

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Created January 1, 1999, Updated February 19, 2017
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