Rolain, Y.
, Van Moer, W.
, Jargon, J.
and DeGroot, D.
(2005),
On Peculiarities of S-Parameter Measurements, ARFTG Microwave Measurement Conference, Long Beach, CA, USA
(Accessed May 3, 2025)
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On Peculiarities of S-Parameter Measurements
Published
Author(s)
Yves Rolain, Wendy Van Moer, ,
Abstract
Measured S-parameters are a key factor for many measurement/modeling applications. Experience teaches that quantities that are derived from the measurements can contain spikes, and that they tend to grow with connection imperfections. In this paper, a possible theoretical explanation is sought and the presence of the peaks is shown on practical measurements. The measured propagation factor and characteristic impedance of a transmission line are used as an illustrative example.Proceedings Title
ARFTG Microwave Measurement Conference
Conference Dates
June 12-17, 2005
Conference Location
Long Beach, CA, USA
Conference Title
65th ARFTG MICROWAVE MEASUREMENT CONFERENCE MEASUREMENTS FOR MILLIMETER-WAVE APPLICATIONS
Pub Type
Conferences
Keywords
impedance, measurements, microwaves, propagation constant, transmission lines
Citation
Issues
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Created June 16, 2005, Updated October 12, 2021