We model a load using an artificial neural network (ANN) to improve an on-wafer line-reflect-match (LRM) calibration of a vector network analyzer. The ANN is trained with measurement data obtained from a thru-reflect-line (TRL) calibration. The accuracy of the LRM calibration using the ANN-modeled load compares favorably to a benchmark multiline TRL calibration with an average worst-case scattering parameter error bound of 0.017 over a 40 GHz bandwidth.
Conference Dates: September 24-28, 2001
Conference Location: London, UK
Conference Title: European Microwave Conference
Pub Type: Conferences
artificial neural network, calibration, line-refelct-match, network analyzer