IPOG: A General Strategy for t-Way Software Testing

Published

March 29, 2007

Author(s)

Yu Lei, Raghu N. Kacker, D. Richard Kuhn, Vadim Okun, James F. Lawrence

Abstract

Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In this paper, we generalize an existing strategy, called In-Parameter-Order (IPO), from pairwise testing to t-way testing. A major challenge of our generalization effort is dealing with the combinatorial growth of the number of combinations of parameter-values. We describe a t-way testing tool, called FireEye, and discuss design decisions that are made to enable an efficient implementation of the generalized IPO strategy. We also report several experiments that are designed to evaluate the effectiveness of FireEye.

Conference Dates

March 26-29, 2007

Conference Location

Tucson, AZ, US

Conference Title

14th Annual IEEE International Conference and Workshops on the Engineering of Computer Based Systems (ECBS'07)

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/ECBS.2007.47

Local Download

Keywords

Combinatorial Testing, Software Testing, T-Way Testing

Citation

Lei, Y. , Kacker, R. , Kuhn, D. , Okun, V. and Lawrence, J. (2007), IPOG: A General Strategy for t-Way Software Testing, 14th Annual IEEE International Conference and Workshops on the Engineering of Computer Based Systems (ECBS'07), Tucson, AZ, US, [online], https://doi.org/10.1109/ECBS.2007.47, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50944 (Accessed October 7, 2025)