An Overview of Nano-Micro-Meso Scale Manufacturing at the NIST

Published

March 13, 2000

Author(s)

E Amatucci, Nicholas Dagalakis, Bradley N. Damazo, Matthew A. Davies, John Evans, Jun-Feng Song, E C. Teague, Theodore V. Vorburger

Abstract

The future of nano-, micro- and meso-scale manufacturing operations will be strongly influenced by a new breed of assembly and manufacturing tools that will be intelligent, flexible, more precise, include in-process production technologies and make use of advanced part design, assembly and process data. To prioritized NIST efforts in nano, micro and meso manufacturing, several visits to industrial and government research laboratories and two workshops were organized. The identified needs at the meso and micro Scale include: dimensional and mechanical metrology, assembly and packaging technology and standards, and providing a science base for materials and processes emphasizing mater5ials testing methods and properties data. Nanocharacterization, nanomanipulation, nanodevices and magnetics industry support have been identified at the nanoscale. Nanometrology and nanomanipulation have a substantial base from which to expand within the Manufacturing Engineering Laboratory (MEL). There fore, MEL is initiating a new long-term Strategic Program in nano-manufacturing to conduct research and developemnt, to provide the measurements and standards needed by industry to measure, manipulate and manufactrue nanoscale discrete part products. The program will address the measurement and standards issues associated with the manufacture of both nanoscale products themselves, as well as with th e development of the production systems required for their manufacture.

Conference Dates

March 13-15, 2000

Conference Location

Gaithersburg, MD, USA

Conference Title

Nanotribology: Critical Assessment and Future Research Needs

Pub Type

Conferences

Keywords

assembly and packaging, dimensional metrology, discrete part manufacturing, measurement standards, meso manufacturing, nano-manufacturing, nanocharacterization, nanodevices, nanomanipulation

Citation

Amatucci, E. , Dagalakis, N. , Damazo, B. , Davies, M. , Evans, J. , Song, J. , Teague, E. and Vorburger, T. (2000), An Overview of Nano-Micro-Meso Scale Manufacturing at the NIST, Nanotribology: Critical Assessment and Future Research Needs, Gaithersburg, MD, USA (Accessed October 10, 2025)