Investigations on the measurement of the leakage resistance to ground of a NIST Programmable Josephson Voltage Standard

Published

August 24, 2014

Author(s)

Stephane Solve, Regis Chayramy, Alain Rufenacht, Charles J. Burroughs, Samuel Benz

Abstract

The Programmable Josephson Voltage Standard (PJVS) leakage resistance to ground (LRG) is defined as the electrical resistance of one side of the measurement leads to ground. Under certain measurement conditions, this resistance can produce a significant systematic voltage error of the measured value of the PJVS output voltage. In particular, if the low side of the array is grounded, for instance in a direct comparison measurement with another JVS, then the LRG will reduce the PJVS output voltage. At 10 V, an error of 0.5 nV can be achieved with a LRG of 50 G if the measurement leads have a total resistance of 2.5 . The LRG and the path of the leakage current to ground are difficult to determine. Furthermore, its corresponding voltage error is still present while the bias source is in operation to control the PJVS. It is therefore important to apply different measurement techniques to compare the corresponding LRG values.

Proceedings Title

Conference on Precision Electromagnetic Measurements Conference Digest

Conference Dates

August 24-29, 2014

Conference Location

Rio de Janeiro, BR

Conference Title

Conference on Precision Electromagnetic Measurements

Pub Type

Conferences

Download Paper

https://doi.org/10.1109/CPEM.2014.6898459

Local Download

Keywords

Leakage resistance to ground, Isolation resistance, Primary Voltage Standard, Josephson Voltage Standard, 10 V programmable array of Josephson junctions

Citation

Solve, S. , Chayramy, R. , Rufenacht, A. , Burroughs, C. and Benz, S. (2014), Investigations on the measurement of the leakage resistance to ground of a NIST Programmable Josephson Voltage Standard, Conference on Precision Electromagnetic Measurements Conference Digest, Rio de Janeiro, BR, [online], https://doi.org/10.1109/CPEM.2014.6898459, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=915386 (Accessed October 8, 2025)