Errors in trapped-ion quantum gates due to spontaneous photon scattering

Published

April 27, 2007

Author(s)

R Ozeri, Wayne M. Itano, Brad R. Blakestad, Joseph W. Britton, J Chiaverini, John D. Jost, C. Langer, Dietrich G. Leibfried, Rainer Reichle, Signe Seidelin, Janus Wesenberg, David J. Wineland

Abstract

We analyze the error in trapped-ion, hyperfine qubit, quantum gates due to spontaneous scattering of photons from the gate laser beams. We investigate the error in single-ion-qubit rotations that are based on stimulated Raman transitions and in two-ion-qubit entangling phase-gates that are based on spin-dependent forces. This error is compared between different ion species currently investigated as possible quantum information carriers. For both gate types we show that the scattering error can possibly be reduced to below current estimates of the fault-tolerance error threshold with the use of realistic laser power.

Citation

Physical Review A (Atomic, Molecular and Optical Physics)

Volume

75

Issue

042329

Pub Type

Journals

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Keywords

decoherence, quantum information processing, spontaneous photon scattering, trapped-ions

Citation

Ozeri, R. , Itano, W. , Blakestad, B. , Britton, J. , Chiaverini, J. , Jost, J. , Langer, C. , Leibfried, D. , Reichle, R. , Seidelin, S. , Wesenberg, J. and Wineland, D. (2007), Errors in trapped-ion quantum gates due to spontaneous photon scattering, Physical Review A (Atomic, Molecular and Optical Physics), [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50462 (Accessed October 13, 2025)