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Harnessing the extreme ultraviolet for critical dimension metrology

Published

Author(s)

Bryan Barnes

Abstract

No DOI. 26 slides.
Citation
FCMN presentation archives

Citation

Barnes, B. (2026), Harnessing the extreme ultraviolet for critical dimension metrology, FCMN presentation archives, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=962164, https://www.pathlms.com/avstechnicallibrary/events/12222/event_sections/19435/slide_presentations/558210 (Accessed September 1, 2026)
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Created June 9, 2026, Updated August 31, 2026
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