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Digital Correlation System for Noise-parameter Measurements on Low-noise Amplifier

Published

Author(s)

Dazhen Gu, Xifeng Lu, Daniel Kuester

Abstract

We presented instrumentation development for measuring noise parameters of low-noise amplifiers and transistors. The instrument is based on noise wave model and samples noise signals with dual digital channels. The system assembly design is complete and the construction is in process.
Proceedings Title
2025 PhotonIcs & Electromagnetics Research Symposium
Conference Dates
November 5-9, 2025
Conference Location
Chiba, JP

Citation

Gu, D. , Lu, X. and Kuester, D. (2026), Digital Correlation System for Noise-parameter Measurements on Low-noise Amplifier, 2025 PhotonIcs & Electromagnetics Research Symposium, Chiba, JP, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=957935 (Accessed April 11, 2026)

Issues

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Created April 1, 2026, Updated April 10, 2026
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