Charge-exchange processes in EBIT: implications for spectral analysis of few-electron Fe ions

Published

April 16, 2025

Author(s)

Yang Yang, FNU Dipti, Amy Gall, Nancy Brickhouse, Hunter Staiger, Galen O'Neil, Paul Szypryt, Adam Foster, David Schultz, Aung Naing, Joseph Tan, Daniel Swetz, Michael Fogle, Randall Smith, Yuri Ralchenko, Endre Takacs

Abstract

Charge-exchange recombination with neutral atoms significantly influences the ionization balance in electron beam ion traps (EBIT) because its cross section is relatively large compared to cross sections of electron collision induced processes. Modeling the highly charged ion cloud requires the estimate of operating parameters, such as electron beam energy and density, the density of neutral atoms, and the relative velocities of collision partners. Uncertainty in the charge-exchange cross section can dominate the overall uncertainty in EBIT experiments, especially when it compounds with the uncertainties of experimental parameters that are difficult to determine. We present measured and simulated spectra of few-electron Fe ions, where we used a single charge-exchange factor to reduce the number of free parameters in the model. The deduction of the charge-exchange factor from the ratio of Li-like and He-like features allows for predicting the intensity of H-like lines in the spectra.

Citation

Journal of Instrumentation

Volume

20

Pub Type

Journals

Download Paper

https://doi.org/10.1088/1748-0221/20/04/C04028

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Keywords

Beam dynamics, X-ray detectors

Citation

Yang, Y. , Dipti, F. , Gall, A. , Brickhouse, N. , Staiger, H. , O'Neil, G. , Szypryt, P. , Foster, A. , Schultz, D. , Naing, A. , Tan, J. , Swetz, D. , Fogle, M. , Smith, R. , Ralchenko, Y. and Takacs, E. (2025), Charge-exchange processes in EBIT: implications for spectral analysis of few-electron Fe ions, Journal of Instrumentation, [online], https://doi.org/10.1088/1748-0221/20/04/C04028, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=959109 (Accessed October 28, 2025)