Background and blended spectral line reduction in precision spectroscopy of EUV and x-ray transitions in highly charged ions

Published

March 3, 2023

Author(s)

Yuri Ralchenko, Joseph N. Tan, Aung S. Naing, Galen O'Neil, Paul Szypryt, Dipti Dipti, Grant Mondeel, Roshani Silwal, Alain Lapierre, Steven Blundell, Gerald Gwinner, Antonio Camargo Villari, Endre Takacs

Abstract

We report a method in EBIT spectral analysis that reduces signal from contaminant lines of 1 known or unknown origin. We utilize similar ion charge distributions of heavy highly charged ions 2 that create similar potentials for lighter contaminating background elements. Extreme ultraviolet 3 spectra of Na-like and Mg-like Os and Ir were recorded at the National Institute of Standards and 4 Technology using a grazing incidence spectrometer. First order approximations to ion distributions 5 are also presented to demonstrate differences between impurity elements with and without heavy 6 ions present.

Citation

Atoms

Volume

11

Issue

3

Pub Type

Journals

Download Paper

https://doi.org/10.3390/atoms11030048

Local Download

Keywords

spectroscopy, highly-charged ions, EBIT, line blen

Citation

Ralchenko, Y. , Tan, J. , Naing, A. , O'Neil, G. , Szypryt, P. , Dipti, D. , Mondeel, G. , Silwal, R. , Lapierre, A. , Blundell, S. , Gwinner, G. , Camargo Villari, A. and Takacs, E. (2023), Background and blended spectral line reduction in precision spectroscopy of EUV and x-ray transitions in highly charged ions, Atoms, [online], https://doi.org/10.3390/atoms11030048, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935979 (Accessed October 7, 2025)