Gans, W.
and Nahman, N.
(1973),
Pulse testing of RF and microwave components:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NBS.IR.73-325
(Accessed May 3, 2025)
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.