Cryogenic microwave loss in epitaxial Al/GaAs/Al trilayers for superconducting circuits

Published

January 14, 2021

Author(s)

Corey Rae McRae, A. McFadden, Ruichen Zhao, Haozhi Wang, Junling Long, Tongyu Zhao, Sungoh Park, Mustafa Bal, Christopher J. Palmstrom, David P. Pappas

Abstract

Epitaxially grown superconductor/dielectric/superconductor trilayers have the potential to form high-performance superconducting quantum devices and may even allow scalable superconducting quantum computing with low-surface-area qubits such as the merged-element transmon. In this work, we measure the power-independent loss and two-level-state (TLS) loss of epitaxial, wafer-bonded, and substrate-removed Al/GaAs/Al trilayers by measuring lumped element superconducting microwave resonators at millikelvin temperatures and down to single-photon powers. The power-independent loss of the device is (4.8±0.1)×10−5, and the resonator-induced intrinsic TLS loss is (6.4±0.2)×10−5. Dielectric loss extraction is used to determine a lower bound of the intrinsic TLS loss of the trilayer of 7.2×10−5. The unusually high power-independent loss is attributed to GaAs's intrinsic piezoelectricity.

Citation

Journal of Applied Physics

Volume

129

Issue

2

Pub Type

Journals

Download Paper

https://doi.org/10.1063/5.0029855

Local Download

Citation

McRae, C. , McFadden, A. , Zhao, R. , Wang, H. , Long, J. , Zhao, T. , Park, S. , Bal, M. , Palmstrom, C. and Pappas, D. (2021), Cryogenic microwave loss in epitaxial Al/GaAs/Al trilayers for superconducting circuits, Journal of Applied Physics, [online], https://doi.org/10.1063/5.0029855, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=931069 (Accessed October 8, 2025)